COMPONENT LEVEL ESD TESTING

Authors
VERHAEGE K
Citation
K. Verhaege, COMPONENT LEVEL ESD TESTING, Microelectronics and reliability, 38(1), 1998, pp. 115-128
Citations number
40
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
38
Issue
1
Year of publication
1998
Pages
115 - 128
Database
ISI
SICI code
0026-2714(1998)38:1<115:>2.0.ZU;2-B
Abstract
This paper reviews different aspects of ESD component level testing. T raditional and alternate test methods are addressed. Focus topics are the device-under-test to tester interaction, the tester specifications and parasitics, the test procedures and test result reproduction and correlation. The purpose of the paper is to serve as a tutorial on the subject of Component Level ESD Testing. (C) 1998 Elsevier Science Ltd .