PIEZOELECTRICAL SHEAR-FORCE DISTANCE CONTROL IN NEAR-FIELD OPTICAL MICROSCOPY FOR BIOLOGICAL APPLICATIONS

Citation
O. Hollricher et al., PIEZOELECTRICAL SHEAR-FORCE DISTANCE CONTROL IN NEAR-FIELD OPTICAL MICROSCOPY FOR BIOLOGICAL APPLICATIONS, Ultramicroscopy, 71(1-4), 1998, pp. 143-147
Citations number
12
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
71
Issue
1-4
Year of publication
1998
Pages
143 - 147
Database
ISI
SICI code
0304-3991(1998)71:1-4<143:PSDCIN>2.0.ZU;2-M
Abstract
We present a piezoelectrical shear-force distance control setup for sc anning near-field optical microscopy. The setup is compact and tip exc hange is easy. The topographical sensitivity is comparable to optical feedback systems. With an acceptable vibration amplitude of 5-10 nm we obtained a topographical resolution of 5 pm/root Hz. Because there is no laser necessary for tip position feedback, there is no extraneous light to interfere with spectroscopic and other low-light level experi ments. Our technique permits measurements of soft biological samples i n aqueous solution, which opens up many possible applications of near- field optical microscopy in biology and medicine. (C) 1998 Elsevier Sc ience B.V. All rights reserved.