DETERMINATION OF THE SHEAR FORCE MAGNITUDE IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY

Authors
WEI PK FANN WS
Citation
Pk. Wei et Ws. Fann, DETERMINATION OF THE SHEAR FORCE MAGNITUDE IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 159-163
Citations number
12
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
71
Issue
1-4
Year of publication
1998
Pages
159 - 163
Database
ISI
SICI code
0304-3991(1998)71:1-4<159:DOTSFM>2.0.ZU;2-G
Abstract
The shear forces between a tapered fiber probe and a glass slice sampl e were determined without any fitting parameter. The calculations were based on a continuous mechanical model which includes the realistic t apered liber shape, The input parameters for the model, the vibration amplitude and phase changes during the tip and sample interactions, we re measured directly by a modified beam diffraction method. (C) 1998 E lsevier Science B.V. All rights reserved.