AN APPROACH TO SPECTROSCOPY AND PHASE MEASUREMENTS IN SCANNING PLASMON NEAR-FIELD MICROSCOPY

Authors
BONEBERG J OCHMANN M MUNZER HJ LEIDERER P
Citation
J. Boneberg et al., AN APPROACH TO SPECTROSCOPY AND PHASE MEASUREMENTS IN SCANNING PLASMON NEAR-FIELD MICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 345-350
Citations number
13
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
71
Issue
1-4
Year of publication
1998
Pages
345 - 350
Database
ISI
SICI code
0304-3991(1998)71:1-4<345:AATSAP>2.0.ZU;2-P
Abstract
A new optical setup for plasmon near-field optical microscopes is intr oduced which allows to improve the signal/background ratio independent ly of the wavelength used and therefore makes the spectroscopy feasibl e. Calculated nd experimental examples demonstrate this improvement ob tained by addition of ellipsometric components. Furthermore, a first m easurement in combination with a scanning tunnelling microscope shows that ir is possible to extrude phase information from this setup as we ll. (C) 1998 Elsevier Science B.V. All rights reserved.