Single crystal films of ZnSe have been grown on nonpolar GaAs(110) sur
faces by molecular beam epitaxy (MBE). The epitaxial films have been c
haracterized by in situ reflection high-energy electron diffraction (R
HEED), ex situ scanning electron microscopy (SEM) and X-ray diffractio
n. RHEED and SEM images of the surfaces reveal the formation of facets
which are aligned along the [001] direction. The formation of facets
indicates that ZnSe growth on the (110) surface proceeds 6 degrees-13
degrees off the vicinal (110) surface. Facet-free ZnSe surface has bee
n successfully grown on a GaAs(110) 6 degrees-off the substrate. (C) 1
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