Quaternary InAsPSb epitaxial layers have been directly grown on InAs s
ubstrate without buffer layer using both the supercooling and step-coo
ling liquid-phase epitaxy (LPE) techniques. Some properties of InAsPSb
/InAs layers were investigated. The quaternary layer is lattice matche
d to InAs by about 1.6 x 10(-3). X-ray diffraction spectra half-width
maximum of the quaternary epilayer is about 200 s. I-V characteristics
of the p-n junction formed between p-InAsPSb and n-InAs substrate was
measured at 300 and 77 Fl. The laser emission with wavelength of 3.09
mu m was observed at 12 K from the p-n junction of the p-InAs0.82P0.1
2Sb0.06 epilayers and the n-InAs substrate. (C) 1998 Elsevier Science
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