X. Castel et al., HIGH CRYSTALLINE QUALITY CEO2 BUFFER LAYERS EPITAXIED ON (1(1)UNDER-BAR-02) SAPPHIRE FOR YBA2CU3O7 THIN-FILMS, Journal of crystal growth, 187(2), 1998, pp. 211-220
(0 0 1)CeO2 thin films and bilayer (0 0 1)YBa2Cu3O7/(0 0 1)CeO2 films
grown in situ by pulsed laser deposition (PLD) on single crystal(1 (1)
under bar 0 2) sapphire have been investigated. CeO2 buffer layers ex
hibit single crystal-like quality as proven by the full-width at half-
maximum (FWHM) of the 0 0 2 rocking curve (Delta theta similar to 0.03
degrees) and the channeling minimum yield measured by baskscattering
spectrometry (RBS) (chi(min)similar to 3%). Therefore, the YBa2Cu3O7/C
eO2/Al2O3 heterostructures present sharp interfaces as shown by the ob
servation of Laue oscillations on both CeO2 and YBa2Cu3O7 XRD patterns
. In agreement with this crystalline perfection, YBa2Cu3O7 thin films
present excellent and reproducible superconducting properties: T-c (R
= 0) > 88.5 K, transition width similar to 0.5 K and microwave surface
resistance R-s 0.5-2 m Omega at 10 GHz and 77 K. (C) 1998 Elsevier Sc
ience B.V. All rights reserved.