X-RAY CHARACTERIZATION OF RB EXCHANGED KTP

The use of X-ray double crystal diffractometry for a nondestructive co ntactless determination of Rb concentration depth profile in Rb exchan ged KTiOPO4 crystals is demonstrated. Two types of layers, relaxed and strained, can be formed via the exchange process, depending on the ex perimental conditions. In the latter case, the exchanged layer was fou nd to be totally strained as was determined from measurement of asymme tric X-ray reflections. The Rb and strain distribution profiles were c alculated using the (0 0 8) symmetric reflection. (C) 1998 Published b y Elsevier Science B.V. All rights reserved.