GATED SI FIELD EMITTER ARRAY PREPARED BY USING ANODIZATION

Citation
K. Higa et al., GATED SI FIELD EMITTER ARRAY PREPARED BY USING ANODIZATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 651-653
Citations number
12
Categorie Soggetti
Physics, Applied","Engineering, Eletrical & Electronic
ISSN journal
10711023
Volume
16
Issue
2
Year of publication
1998
Pages
651 - 653
Database
ISI
SICI code
1071-1023(1998)16:2<651:GSFEAP>2.0.ZU;2-2
Abstract
High aspect-ratio gated field emitter arrays have been fabricated usin g silicon tip prepared by the anodization of a silicon wafer with peri odic n/p junctions. The tips were formed by the preferential growth of porous silicon in p-type material and were transferred to a separate silicon substrate by direct bonding. Gate electrodes were then formed by depositing a WSi2 film over the tips, and apertures were subsequent ly coated by etching with an argon milling process. The resulting gate d tip arrays demonstrated field emission, although higher than usual g ate voltages were required. (C) 1998 American Vacuum Society. [S0734-2 11X(98)01102-0].