H. Mimura et al., RESONANT FOWLER-NORDHEIM TUNNELING EMISSION FROM METAL-OXIDE-SEMICONDUCTOR CATHODES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 803-806
A metal-oxide-semiconductor tunneling cathode was fabricated with an u
ltrathin oxide layer and an abrupt interface between the oxide layer a
nd the polycrystalline Si gate electrode. The emission current shows p
eriodic deviations on the Fowler-Nordheim plot estimated by the Wentze
l-Kramers-Brillouin (WKB) approximation. The peaks in the oscillations
are confirmed to arise from the resonant effect of electron tunneling
by comparing the experimental results with the theoretical calculatio
ns. This article describes the first experiment of resonant tunneling
emission. (C) 1998 American Vacuum Society. [S0734-211X(98)02502-5].