Y. Miyamoto et al., METAL-INSULATOR-SEMICONDUCTOR EMITTER WITH AN EPITAXIAL CAF2 LAYER ASTHE INSULATOR, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 851-854
An 8-nm-thick epitaxial CaF2 layer grown on an n(+)-Si substrate was u
sed as the insulator in a metal-insulator-semiconductor cathode with a
10 mu m(2) emitter region. The fabricated cathodes exhibited two diff
erent types of I-V characteristics. The first type showed conventional
tunnel emission current of 22 pA at an emitter current of 2.4 mA and
an emitter voltage of 7 V. The emitter with the other type of characte
ristics showed an emission current of 5.6 nA at an emitter current of
2.2 mA and an emitter voltage of 4.5 V but it showed current instabili
ty. (C) 1998 American Vacuum Society. [S0734-211X(98)03602-6].