Sy. Kang et al., EMISSION CHARACTERISTICS OF TIN-COATED SILICON FIELD EMITTER ARRAYS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 871-874
We observed the emission characteristics and stability of TiN-coated S
i field emitter arrays (FEAs) with a TIW gate structure. The TiN layer
on Si tips was formed by a two-step rapid thermal nitridation process
in an NH3 ambient by which a Ti layer was thermally converted to a Ti
N/TiSi2 bilayer. This process could suppress the formation of TiO2 on
the surface and make the TiN layer thicker than a one-step process. By
coating Si tips with TiN, the operating voltage of the TiN-coated Si
FEAs was reduced by about 20 V compared with non-coated ones. Also, th
e TiN-coated Si FEAs showed thermally stable electron emission compare
d with non-coated ones. (C) 1998 American Vacuum Society. [S0734-211X(
98)08002-0].