This paper reviews the development of positive DUV resists at IBM and
Shipley. The review begins with APEX-E the prototypical chemically amp
lified positive DUV resist used throughout the semiconductor industry.
The paper then follows the emergence of new resist technology to over
come the weaknesses of first generation DUV resists like APEX-E. These
improvements include feature-specific resists for low k(1) processing
, improved delay stability, improved PEB sensitivity, better etch resi
stance, and reduced substrate dependence. A new series of annealing ty
pe resists, UV5, UV6, and Titan have demonstrated all of these improve
ments.