T. Tada et al., FABRICATION OF SIZE-CONTROLLED 10-NM SCALE SI PILLARS USING METAL-CLUSTERS AS FORMATION NUCLEI, Microelectronic engineering, 42, 1998, pp. 539-542
10-nm scale Si pillars were fabricated using deposited Au, Ag, Cu clus
ters and colloidal Au particles as nuclei for formation of etch masks
in SF, microwave plasma etching at about -130 degrees C. The pillar di
ameter is affected by the chemical species of the clusters, but is onl
y weakly dependent on the cluster size. The average diameter of pillar
s fabricated with Au clusters is 9 nm, while those with Ag and Cu clus
ters are 19 and 24 nm, respectively. This is considered to be due to t
he difference in stability of the compounds of Au, Ag, and Cu with S o
r F, the components of the etching gas, which results in a different a
bility to form etch masks by condensation of SxFy species.