SELECTIVE-AREA EPITAXY OF GAAS USING TRI-ISOPROPYLGALLIUM

Citation
R. Zhang et al., SELECTIVE-AREA EPITAXY OF GAAS USING TRI-ISOPROPYLGALLIUM, Journal of electronic materials, 27(5), 1998, pp. 446-450
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
27
Issue
5
Year of publication
1998
Pages
446 - 450
Database
ISI
SICI code
0361-5235(1998)27:5<446:SEOGUT>2.0.ZU;2-Q
Abstract
We have studied the selective area epitaxy of GaAs by chemical beam ep itaxy, using tri-isopropylgallium as the Ga source. The results show t hat GaAs can be selectively grown at a rate of up to similar to 0.36 m u m/h on patterned GaAs substrates at temperatures as low as 380 degre es C. A low selective growth temperature allows us to utilize deep-ult raviolet radiation to modify the GaAs surface oxides for use as the ma sking material. We found that excess AsH3 over-pressure degrades the s electivity significantly, and the maximum selective growth thickness i s limited by a critical total adatom coverage on the mask. In addition , the low selective growth temperature does not result in a very high C background concentration. Initial Hall measurements indicate that un intentional C doping levels are at least two orders of magnitude lower than those in GaAs layers grown under comparable conditions using tri methylgallium.