We have studied the selective area epitaxy of GaAs by chemical beam ep
itaxy, using tri-isopropylgallium as the Ga source. The results show t
hat GaAs can be selectively grown at a rate of up to similar to 0.36 m
u m/h on patterned GaAs substrates at temperatures as low as 380 degre
es C. A low selective growth temperature allows us to utilize deep-ult
raviolet radiation to modify the GaAs surface oxides for use as the ma
sking material. We found that excess AsH3 over-pressure degrades the s
electivity significantly, and the maximum selective growth thickness i
s limited by a critical total adatom coverage on the mask. In addition
, the low selective growth temperature does not result in a very high
C background concentration. Initial Hall measurements indicate that un
intentional C doping levels are at least two orders of magnitude lower
than those in GaAs layers grown under comparable conditions using tri
methylgallium.