B. Vandevelde et al., THERMOMECHANICAL MODELS FOR LEADLESS SOLDER INTERCONNECTIONS IN FLIP-CHIP ASSEMBLIES, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(1), 1998, pp. 177-185
Analytical thermomechanical models have been developed in order to cal
culate the thermally induced stresses in leadless solder interconnecti
on systems. Two different analytical models are highlighted: the perip
heral and area array thermomechanical model which describe the thermal
ly induced stresses for two components connected to each other with a
peripheral, respectively, area array of joints, The analytical models
are based on structural mechanics and have the ability to characterize
the nature and estimate the magnitude of the joint stresses. Using th
ese models, structural design optimization of interconnection systems
can be performed very quickly in order to reduce time consuming experi
ments and finite element simulations. It is found that the largest str
esses in the solder joints of flip chip assemblies are at the top and
bottom surface of the: connection and that they are especially caused
by bending moments subjected to the joints, Comparisons with finite el
ement simulations have proved a good accuracy of the thermomechanical
models.