STRUCTURES FOR ESD PROTECTION IN CMOS PROCESSES

Authors
FRIED R BLECHER Y FRIEDMAN S
Citation
R. Fried et al., STRUCTURES FOR ESD PROTECTION IN CMOS PROCESSES, Microelectronics and reliability, 37(7), 1997, pp. 1111-1120
Citations number
20
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
37
Issue
7
Year of publication
1997
Pages
1111 - 1120
Database
ISI
SICI code
0026-2714(1997)37:7<1111:SFEPIC>2.0.ZU;2-X
Abstract
This paper reviews the basic building blocks that are used for CMOS ES D protection structures, circuit and layout effects are considered. Th e performance of several structures is characterized in order to demon strate the different effects. Guide-lines and recommendations for prop er protection structure implementation are given. (C) 1997 Elsevier Sc ience Ltd.