X-RAY PHOTOELECTRON SPECTROSCOPIC COMPARISON OF SPUTTERED TI, TI6AL4V, AND PASSIVATED BULK METALS FOR USE IN CELL-CULTURE TECHNIQUES (VOL A9, PG 1329, 1991)

Authors
SODHI RNS WENINGER A DAVIES JE SREENIVAS K
Citation
Rns. Sodhi et al., X-RAY PHOTOELECTRON SPECTROSCOPIC COMPARISON OF SPUTTERED TI, TI6AL4V, AND PASSIVATED BULK METALS FOR USE IN CELL-CULTURE TECHNIQUES (VOL A9, PG 1329, 1991), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(1), 1994, pp. 267-267
Citations number
1
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
12
Issue
1
Year of publication
1994
Pages
267 - 267
Database
ISI
SICI code
0734-2101(1994)12:1<267:XPSCOS>2.0.ZU;2-T