K. Chakrabarty et Jp. Hayes, ZERO-ALIASING SPACE COMPACTION OF TEST RESPONSES USING MULTIPLE PARITY SIGNATURES, IEEE transactions on very large scale integration (VLSI) systems, 6(2), 1998, pp. 309-313
We present a parity-based space compaction technique that eliminates a
liasing for any given fault model. The test responses from a circuit u
nder test with a large number of primary outputs are merged into a nar
row signature stream using a multiple-output parity tree. The function
s realized by the different outputs of the compactor are determined by
a procedure that targets the desired fault model, Experimental result
s for the ISCAS-85 benchmarks show that zero aliasing of single stuck-
line faults can be achieved with a two-output parity tree compactor. O
ur findings corroborate recent results on the fundamental limits of sp
ace compaction.