ON THE RELIABILITY OF QUANTITATIVE PHASE MEASUREMENTS BY LOW MAGNIFICATION OFF-AXIS IMAGE PLANE ELECTRON HOLOGRAPHY

We experimentally found that the object wave function of an electron w ave in a transmission electron microscope can depend on the diameter o f the condenser aperture and on the excitation of the objective lens. This can be seen by low magnification holograms utilizing as sample el ectrically charged latex spheres of different diameters, the electric held at a pn-junction and the magnetic leakage field of a magnetic mem ory cell. (C) 1998 Published by Elsevier Science B.V. All rights reser ved.