Thick films of photoconducting CdS containing special glass frit have
been prepared and characterized by X-ray diffractometry and scanning e
lectron microscopy. Such 'fritted' thick films of photoconducting CdS
reveal improved adherence and exhibit relatively high photosensitivity
of the order of 10(5) when doped with optimum concentration of chlori
ne compensated acceptor-type impurity. (C) 1998 Elsevier Science S.A.
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