FABRICATION OF ASPHERIC HIGH NUMERICAL APERTURE REFLECTIVE DIFFRACTIVE OPTIC ELEMENTS USING ELECTRON-BEAM LITHOGRAPHY

Citation
D. Mikolas et al., FABRICATION OF ASPHERIC HIGH NUMERICAL APERTURE REFLECTIVE DIFFRACTIVE OPTIC ELEMENTS USING ELECTRON-BEAM LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(1), 1994, pp. 20-25
Citations number
14
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
12
Issue
1
Year of publication
1994
Pages
20 - 25
Database
ISI
SICI code
1071-1023(1994)12:1<20:FOAHNA>2.0.ZU;2-P
Abstract
Electron beam lithography and reactive ion etching have been used to f abricate four level aspheric reflecting focusing diffractive optical e lements. A fast (f/2), 1 mm diam, four-phase-level, reflecting, off-ax is imaging diffractive optical element, without spherical aberration, coma, and astigmatism, has been fabricated on silicon. Alignment and s titching errors have been held to less than 40 nm and the smallest pat tern feature is 0.6 mum. The silicon grating is coated with gold to en hance reflectivity with an efficiency of 73%. The quality of diffracti ve optical elements is limited by the fidelity of the fabrication step s, and methods are demonstrated for proximity effect correction, align ment, high selectivity mask creation, and reactive ion etching that ca n be used for high quality diffractive optic element fabrication of es sentially arbitrary type.