Ak. Kulkarni et al., ELECTRICAL, OPTICAL, AND STRUCTURAL-PROPERTIES OF INDIUM-TIN-OXIDE THIN-FILMS DEPOSITED ON POLYETHYLENE TEREPHTHALATE SUBSTRATES BY RF-SPUTTERING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1636-1640
Citations number
17
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Indium-tin-oxide (ITO) is a transparent conducting material which is d
eposited as a thin film on glass substrates for use in opto-electronic
devices. However, there are several applications for which ITO films
on polymeric substrates are desirable. The sheet resistance, optical t
ransmittance, and microstructure of as-deposited ITO thin films on unh
eated polyethylene terephthalate substrates were studied using rf sput
ter deposition. During separate deposition runs, the partial pressure
of oxygen was varied from 5% to 20% and the deposition time was varied
from 15 to 120 min. No significant variations are observed in the she
et resistance with respect to oxygen partial pressure; however, change
s in sheet resistance were observed in ITO films deposited on differen
t substrates for short deposition times (15 min). Additionally, the th
ickness of the film (assumed to be proportional to the deposition time
) is shown to have a considerable impact on the sheet resistance and t
he optical transmittance. The x-ray diffraction data coupled with the
sheet resistance data suggest that ITO films exhibiting a preferred (4
00) orientation have the highest sheet conductance. The changes observ
ed in the sheet resistance, optical transmittance, and the refractive
index due to the thickness of the film or oxygen partial pressure duri
ng deposition are explained on the basis of surface roughness, free ca
rrier concentration, and the microstructure of the film. (C) 1998 Amer
ican Vacuum Society.