Y. Lee et al., SURFACE STUDIES OF PLASMA SOURCE ION-IMPLANTATION TREATED POLYSTYRENE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1710-1715
Citations number
22
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
The plasma source ion implantation (PSII) was utilized to improve the
wettability and the stability of surface layer formed in the modificat
ion of polymeric materials. Polystyrene was treated with different kin
ds of plasma ions to render the surface more hydrophilic or hydrophobi
c. Hydrophobic recovery of PSII-treated polystyrene was also observed
as a function of aging time, aging temperature, and treatment paramete
rs. Treatment parameters involve kinds of gases, pressure, plasma powe
r, pulse frequency, pulse voltage, etc. To study the effect of inert g
as on hydrophobic recovery, polystyrene samples were prepared by heliu
m, argon, or gas-mixture treatment. Time-of-flight secondary ion mass
spectrometry (TOF-SIMS) has been used to interpret the PSII-treated po
lystyrene surface and its hydrophobic recovery, with the assistance of
x-ray photoelectron spectroscopy and water contact angle measurements
. TOF-SIMS spectra of O-18(2) PSII-treated samples showed the presence
of O-18-containing peaks from the modified surfaces. PSII modificatio
ns provide more stable surfaces of polystyrene as a function of aging
time than plasma treatments. The comparison of aging behavior data all
owed for examination of the differences in the stability of the functi
onality introduced by the two different treatment techniques. (C) 1998
American Vacuum Society.