SCANNING FORCE MICROSCOPY - APPLICATION TO NANOSCALE STUDIES OF FERROELECTRIC DOMAINS

Recent advances in nanoscale studies of ferroelectric domains by means of scanning force microscopy (SFM) are reviewed with particular empha sis on investigation of domain structure and polarization reversal in ferroelectric thin films. Applicability of different SFM modes to doma in imaging with respect to the physical properties of ferroelectrics i s discussed. Examples shown here include results on domain structure o bservation in single crystals and films by SFM operating in the noncon tact, friction, topographic and piezoresponse modes. Domain wall dynam ics and fatigue effects as well as SFM spatial resolution of domain st ructure in thin films are addressed.