Jm. Vanhove et al., MOLECULAR-BEAM EPITAXY-GROWN INGAN MULTIPLE-QUANTUM-WELL STRUCTURES OPTIMIZED USING IN-SITU CATHODOLUMINESCENCE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1286-1288
In this work, in situ cathodoluminescence (CL) is presented as a techn
ique to optimize the molecular beam epitaxy (MBE) growth conditions fo
r InGaN films and structures. InGaN was grown at 1 mu m/h using a reac
tive nitrogen rf plasma source at substrate temperatures ranging from
550 to 650 degrees C. The quick determination of the emission waveleng
th and quality from the peak position and width allowed various growth
conditions and structures to be tried without removal of the sample f
rom the MBE system. CL scans are presented from samples grown under va
rying Ga/In flux ratios, III/nitrogen flux ratios, and substrate tempe
ratures showing the usefulness of in situ monitoring for MBE InGaN gro
wth. (C) 1998 American Vacuum Society.