Es. Jacobs et al., 77 K FAR-INFRARED HOT-ELECTRON MULTI-QUANTUM-WELL DETECTORS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1430-1434
The responsivity to long wavelength (513 and 1253 mu m) far-infrared (
FIR) radiation and the root mean square noise voltage has been measure
d for one bulk GaAs and two GaAs/AlGaAs multiquantum/well (MQW) hot-el
ectron photodetectors as a function of temperature from 4.49 to 77 K.
From these data the noise-equivalent power (NEP) was determined for ea
ch device over the same temperature range. The MQW detectors were meas
ured to have 77 K responsivities and NEPs that were one to two orders
of magnitude better than those measured using the high purity bulk GaA
s sample. To the best of our knowledge, these are the first measuremen
ts which show that hot electron MQW detectors are able to outperform b
ulk GaAs detectors at 77 K. Furthermore, the photoresponse of the MQW
structures showed a much slower temperature dependent rolloff as compa
red to the bulk device, which implies a potential for applications at
temperatures above 77 K. Detection of nanosecond pulses of 496 mu m FI
R radiation by one MQW detector and the bulk GaAs is additional eviden
ce of hot-electron photoconductivity. (C) 1998 American Vacuum Society
.