MULTIWAFER MOLECULAR-BEAM EPITAXY FOR HIGH-VOLUME PRODUCTION OF GAAS ALGAAS HETEROJUNCTION BIPOLAR-TRANSISTOR WAFERS/

Citation
Tr. Block et al., MULTIWAFER MOLECULAR-BEAM EPITAXY FOR HIGH-VOLUME PRODUCTION OF GAAS ALGAAS HETEROJUNCTION BIPOLAR-TRANSISTOR WAFERS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1475-1478
Citations number
4
Categorie Soggetti
Physics, Applied","Engineering, Eletrical & Electronic
ISSN journal
10711023
Volume
16
Issue
3
Year of publication
1998
Pages
1475 - 1478
Database
ISI
SICI code
1071-1023(1998)16:3<1475:MMEFHP>2.0.ZU;2-C
Abstract
Circuits incorporating GaAs/AlGaAs heterojunction bipolar transistors (HBTs) are being increasingly used in commercial applications with vol ume requirements that can only be met using multiwafer reactors. HBT w afers grown in single and multiwafer molecular beam epitaxy (MBE) reac tors are found to be very similar in terms of both material characteri stics and resultant device performance. Postgrowth defect levels are r educed by an order of magnitude with the multiwafer system compared to single wafer systems and are similar to those obtained on commerciall y purchased metal organic chemical vapor deposition wafers. Multiwafer MBE systems are thus shown to be a viable means for the high volume p roduction of HBT wafers. (C) 1998 American Vacuum Society.