DETERMINATION OF CUTOFF WAVELENGTH AND COMPOSITION DISTRIBUTION IN HG1-XCDXTE

Citation
Jh. Chu et al., DETERMINATION OF CUTOFF WAVELENGTH AND COMPOSITION DISTRIBUTION IN HG1-XCDXTE, Journal of electronic materials, 27(6), 1998, pp. 718-721
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
27
Issue
6
Year of publication
1998
Pages
718 - 721
Database
ISI
SICI code
0361-5235(1998)27:6<718:DOCWAC>2.0.ZU;2-C
Abstract
The determination of cut-off wavelength, lambda(co), and composition d istribution for Hg1-xCdxTe has been discussed in this paper. A shift o f the cut-off-wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap E-g but different thi ckness d. An expression of lambda(co)(x,T,d) has been derived from the half-maximum photo-response curve calculation.The composition uniform ity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and therm al imaging technique.