M. Kiuchi et al., THE MICROSTRUCTURE OF TRANSPARENT AND ELECTRICALLY CONDUCTING TITANIUM NITRIDE FILMS, Materials chemistry and physics, 54(1-3), 1998, pp. 330-333
The microstructure of electrically conducting and transparent titanium
nitride (TiN) films, produced by the dynamic ion beam mixing techniqu
e, have been studied. These films consist of small grains of TiN and a
n amorphous layer. The film is continuous and does not react with the
substrate. This paper discusses the morphology and properties of TiN f
ilms and their nucleation process. (C) 1998 Elsevier Science S.A. All
rights reserved.