EFFECT OF AMBIENT VACUUM PRESSURE ON THE CORROSION PROPERTIES OF PUREIRON FILMS FORMED BY THE ION-BEAM DEPOSITION METHOD

Authors
Citation
K. Ohashi et K. Miyake, EFFECT OF AMBIENT VACUUM PRESSURE ON THE CORROSION PROPERTIES OF PUREIRON FILMS FORMED BY THE ION-BEAM DEPOSITION METHOD, Materials chemistry and physics, 54(1-3), 1998, pp. 365-367
Citations number
6
Categorie Soggetti
Material Science
ISSN journal
02540584
Volume
54
Issue
1-3
Year of publication
1998
Pages
365 - 367
Database
ISI
SICI code
0254-0584(1998)54:1-3<365:EOAVPO>2.0.ZU;2-N
Abstract
High purity iron films deposited on Si substrates by the low-energy, m ass-separated ion beam deposition (IBD) method showed the highest corr osion resistance against NaCl solution than any other iron materials. The corrosion properties of the films depend on the ambient vacuum con ditions during film formation. High pressure surroundings seem to brin g gaseous compounds into the films, which make the surfaces unstable o wing to a high density of defects in the films. Surface observations b y transmission electron microscopy indicate the presence of a stable i ron oxide layer on the IBD iron film which had formed under suitable v acuum conditions. The presence of fewer defects in IBD iron film seems to be a prerequisite of this protective oxide layer. (C) 1998 Elsevie r Science S.A. All rights reserved.