T. Yaguchi et al., DEPENDENCE OF GAN MOMBE GROWTH ON NITROGEN-SOURCE - ECR PLASMA GUN STRUCTURE AND MONOMETHYL-HYDRAZINE, Journal of crystal growth, 190, 1998, pp. 380-384
GaN layers were grown on (0 0 1)GaAs substrates by metal-organic molec
ular beam epitaxy (MOMBE), using electron cyclotron resonance (ECR) pl
asma activated nitrogen and monomethyl hydrazine (MMHy) as a nitrogen
(N) source. We investigated dependence of GaN crystalline quality, gro
wth rate and contamination, on the N source, It was found that the gro
wth rate for a borosilicate glass guide tube was higher than that for
quartz guide tube, suggesting that the quartz guide tube kills N radic
als. Unexpectedly, higher oxygen and carbon contamination was detected
for the layer grown with the ECR plasma, gun without the ion extracti
on magnet and quartz, than those for the layer grown with MMHy. (C) 19
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