Undoped and magnesium doped MBE grown GaN epilayers on sapphire substr
ates show a particular variety of near-bandgap luminescent transitions
. Despite the large lattice mismatch to the substrate, pronounced free
- and bound-exciton transitions allow for an estimation of the exciton
ic binding energies. For the given thickness range (about I mu m), we
find an almost strain-relaxed situation with the main exciton transiti
on energies well corresponding to the bulk values. On their low-energy
side, we identify lines having been tentatively assigned to stacking
fault excitons, and interface-related exciton transitions correlated t
o extended defects and/or dislocations in this spatial region. Evidenc
e of cubic inclusions of a size up to 500 nm is doubtless given by obs
erving sharp c-GaN related donor-bound exciton emission and respective
structures in transmission electron microscope investigations. (C) 19
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