Xb. Li et al., PROPERTIES OF GAN EPILAYERS WITH VARIOUS GROWTH-CONDITIONS GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY, Journal of crystal growth, 191(1-2), 1998, pp. 34-38
GaN epilayers on sapphire (0001) substrates were grown by the gas sour
ce molecular beam epitaxy (GSMBE) method using ammonia (NH,) gas as th
e nitrogen source. Properties of gallium nitride (GaN) epilayers grown
under various growth conditions were investigated. The growth rate is
up to 0.6 mu m/h in our experiments. Cathodoluminescence, photolumine
scence and Hall measurements were used to characterize the films. It w
as shown that the growth parameters have a significant influence on th
e GaN properties. The yellow luminescence was enhanced at higher growt
h temperature. And a blue emission which maybe related to defects or i
mpurity was observed. Although the emission at 3.31 eV can be suppress
ed by a low-temperature buffer layer, a high-quality GaN epilayer can
be obtained without the buffer layer. (C) 1998 Elsevier Science B.V. A
ll rights reserved.