LiNb1-xTaxO3 epitaxial films, which were grown on LiNbO3 substrates at
various growth temperatures by the liquid-phase epitaxial method, wer
e characterized using X-ray rocking curves, diffraction-space maps and
absolute lattice constants. The films had relaxed structures regardle
ss of the growth temperature, and the density of the dislocations due
to the lattice mismatch between the films and the substrates increased
with increasing growth temperature. Therefore, the crystallinity of t
he films became poor with increasing growth temperature. (C) 1998 Else
vier Science B.V. All rights reserved.