MGO(100) SURFACE RELAXATION BY SYMMETRIZED AUTOMATED TENSOR LOW-ENERGY-ELECTRON DIFFRACTION ANALYSIS

Authors
FERRY D SUZANNE J PANELLA V BARBIERI A VANHOVE MA BIBERIAN JP
Citation
D. Ferry et al., MGO(100) SURFACE RELAXATION BY SYMMETRIZED AUTOMATED TENSOR LOW-ENERGY-ELECTRON DIFFRACTION ANALYSIS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2261-2266
Citations number
27
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
16
Issue
4
Year of publication
1998
Pages
2261 - 2266
Database
ISI
SICI code
0734-2101(1998)16:4<2261:MSRBSA>2.0.ZU;2-2
Abstract
We present a low energy electron diffraction study of the surface rela xation of MgO(100) at T = 80 K down to the second atomic layer using i n situ cleaved MgO crystals. We find that the main perturbation from t he bulk structure is a topmost surface layer rumpling of 3.3 +/- 1.5% and a very small second layer rumpling of 0.2 +/- 2%. In both cases th e oxygen atom is displaced outward. The first interlayer spacing is sl ightly reduced by 0.2 +/- 0.7% whereas there is no change in the secon d interlayer spacing. (C) 1998 American Vacuum Society. [S0734-2101(98 )02104-6].