BALLISTIC TRANSPORT AND GATE CONTROL MECHANISM IN DEEPLY ETCHED ELECTRON-WAVE-GUIDE BASED DEVICES

Citation
K. Hieke et al., BALLISTIC TRANSPORT AND GATE CONTROL MECHANISM IN DEEPLY ETCHED ELECTRON-WAVE-GUIDE BASED DEVICES, Solid-state electronics, 42(7-8), 1998, pp. 1115-1119
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
42
Issue
7-8
Year of publication
1998
Pages
1115 - 1119
Database
ISI
SICI code
0038-1101(1998)42:7-8<1115:BTAGCM>2.0.ZU;2-P
Abstract
We prepared In0.53Ga0.47As/InP electron waveguides with in-plane side gates by deep etching through a two-dimensional electron gas. In these structures we investigated the conductance dependent on the voltages applied at both gales. Our experiments show a remarkable asymmetry in the gate efficiency: negative gate voltages seem to be more efficient than positive ones, end the pinch-off voltage of the waveguide depends mainly on the more negative sf the two gate voltages. A model is give n which takes the etched surfaces into account. The conductance in the waveguide is essentially determined by the potentials at the etched s urfaces, which are via Schottky-diode transitions coupled with the gat es and the channel. With the help of this model we are able to explain the behavior of the electron waveguides. (C) 1998 Elsevier Science Lt d. All rights reserved.