FERROMAGNETIC SINGLE-ELECTRON TRANSISTOR

Citation
K. Ono et al., FERROMAGNETIC SINGLE-ELECTRON TRANSISTOR, Solid-state electronics, 42(7-8), 1998, pp. 1407-1411
Citations number
18
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
42
Issue
7-8
Year of publication
1998
Pages
1407 - 1411
Database
ISI
SICI code
0038-1101(1998)42:7-8<1407:FST>2.0.ZU;2-9
Abstract
We studied magnetotransport properties of a single electron transistor (SET) consist of Ni/NiO/Co ultrasmall tunnel junctions. At high tempe ratures or at high bias conditions,the SET shows magnetoresistance (MR ) of about 4% which originates from the magnetic valve effect. To inve stigate the magnetic valve effect in Coulomb blockade regime, we measu red the zero-bias MR of the SET for on-state (resistance minimum of Co ulomb oscillations) and off-state (resistance maximum of them) as a fu nction of temperature. The MR ratio of the off-state starts growing bl ow 0.4 K and exceeds 40% at 20 mK, while that of the on-state is tempe rature independent (approximate to 4%). This effect is qualitatively e xplained by quantum fluctuation of charge. We also found that the magn etic held affects the phase of the Coulomb oscillations. A qualitative explanation for this effect is given which is based on spin polarizat ions of the island and the lead electrodes. (C) 1998 Elsevier Science Ltd. All rights reserved.