EPITAXIAL-GROWTH OF NANOMETER-THICK CAF2 CDF2 HETEROSTRUCTURES USING PARTIALLY-IONIZED BEAM EPITAXY/

Citation
M. Watanabe et al., EPITAXIAL-GROWTH OF NANOMETER-THICK CAF2 CDF2 HETEROSTRUCTURES USING PARTIALLY-IONIZED BEAM EPITAXY/, Solid-state electronics, 42(7-8), 1998, pp. 1627-1630
Citations number
18
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
42
Issue
7-8
Year of publication
1998
Pages
1627 - 1630
Database
ISI
SICI code
0038-1101(1998)42:7-8<1627:EONCCH>2.0.ZU;2-4
Abstract
We propose a technique for growing a multilayered superlattice consist ing of several monolayers of CaF2/CdF2 on a Si(lll) substrate using a partially ionized beam technique at 50 degrees C. This technique shoul d be suitable for use in Si based quantum effect devices using CaF2, C dF2, and CoSi2 heterostructures on a Si substrate. Ionization and acce leration were performed for CaF2 evaporation to reduce the required gr owth temperature using a partially ionized CaF2 molecular beam generat ed by electron bombardment. The surface morphology and sharpness of th e heterointerface were improved by the proposed technique as demonstra ted by atomic force microscopy; the lattice image of transmission elec tron microscopy and satellite peaks of X-ray diffractometory. (C) 1998 Elsevier Science Ltd. All rights reserved.