GROWTH AND CHARACTERIZATION OF N-TYPE GAAS ALGAAS QUANTUM-WELL INFRARED PHOTODETECTOR ON GAAS-ON-SI SUBSTRATE/

Citation
Dk. Sengupta et al., GROWTH AND CHARACTERIZATION OF N-TYPE GAAS ALGAAS QUANTUM-WELL INFRARED PHOTODETECTOR ON GAAS-ON-SI SUBSTRATE/, Journal of electronic materials, 27(7), 1998, pp. 858-865
Citations number
24
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
27
Issue
7
Year of publication
1998
Pages
858 - 865
Database
ISI
SICI code
0361-5235(1998)27:7<858:GACONG>2.0.ZU;2-#
Abstract
We present in this article device characteristics of molecular beam ep itaxy grown GaAs/AlGaAs quantum well infrared photodetectors (QWIP) on a semiinsulating GaAs substrate and on a GaAs-on-Si substrate grown b y metalorganic chemical vapor deposition (MOCVD). Important issues for QWIP application such as dark current, spectral response, and absolut e responsivity were measured. We find that the detector structure grow n on a GaAs-on-Si substrate exhibits comparable dark current and absol ute responsivity and a small blue shift, in the spectral response. Thi s is the first demonstration of long wavelength GaAs/AlGaAs quantum we ll infrared photodetector using MOCVD grown GaAs-on-Si substrate and t he performance is comparable to a similar detector structure grown on a GaAs substrate.