C. Wasshuber et H. Kosina, SIMULATION OF A SINGLE-ELECTRON TUNNEL TRANSISTOR WITH INCLUSION OF INELASTIC MACROSCOPIC QUANTUM TUNNELING OF CHARGE, VLSI design (Print), 6(1-4), 1998, pp. 35-38
We simulated a Single Electron Tunnel (SET) Transistor with the full i
nclusion of inelastic macroscopic quantum tunneling of charge (q-MQT)
or co-tunneling. Numerical results of the q-MQT effect over a wide ran
ge of bias and gate voltage were achieved. A Monte Carlo method was us
ed to simulate electrons that tunnel back and forth through the two tu
nnel junctions of the SET transistor and co-tunnel back and forth thro
ugh both junctions simultaneously. Resonances in the I-V characteristi
c were found. The resonant peaks decrease with increasing temperature.
The origin of this resonance is the q-MQT or co-tunnel effect in cont
rast with the normal resonant tunneling in double barriers.