We have investigated three-dimensional (3D) effects in sub-micron GaAs
MESFETs using a parallel Monte Carlo device simulator, PMC-3D [1]. Th
e parallel algorithm couples a standard Monte Carlo particle simulator
for the Boltzmann equation with a 3D Poisson solver using spatial dec
omposition of the device domain onto separate processors. The scaling
properties of the small signal parameters have been simulated for both
the gate width in the third dimension as well as the gate length. For
realistic 3D device structures, we find that the main performance bot
tleneck is the Poisson solver rather than the Monte Carlo particle sim
ulator for the parallel successive overrelaxation (SOR) scheme employe
d in [1]. A parallel multigrid algorithm is reported and compared to t
he previous SOR implementation, where considerable speedup is obtained
.