3D PARALLEL MONTE-CARLO SIMULATION OF GAAS-MESFETS

Citation
S. Pennathur et al., 3D PARALLEL MONTE-CARLO SIMULATION OF GAAS-MESFETS, VLSI design (Print), 6(1-4), 1998, pp. 273-276
Citations number
6
Categorie Soggetti
Computer Science Hardware & Architecture","Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture
Journal title
ISSN journal
1065514X
Volume
6
Issue
1-4
Year of publication
1998
Pages
273 - 276
Database
ISI
SICI code
1065-514X(1998)6:1-4<273:3PMSOG>2.0.ZU;2-0
Abstract
We have investigated three-dimensional (3D) effects in sub-micron GaAs MESFETs using a parallel Monte Carlo device simulator, PMC-3D [1]. Th e parallel algorithm couples a standard Monte Carlo particle simulator for the Boltzmann equation with a 3D Poisson solver using spatial dec omposition of the device domain onto separate processors. The scaling properties of the small signal parameters have been simulated for both the gate width in the third dimension as well as the gate length. For realistic 3D device structures, we find that the main performance bot tleneck is the Poisson solver rather than the Monte Carlo particle sim ulator for the parallel successive overrelaxation (SOR) scheme employe d in [1]. A parallel multigrid algorithm is reported and compared to t he previous SOR implementation, where considerable speedup is obtained .