C. Coupeau et al., PLASTICITY STUDY OF DEFORMED MATERIALS BY IN-SITU ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 1964-1970
The emerging of a single dislocation at a surface creates a step with
a height equal to the Burgers vector component normal to the surface.
By coupling an atomic force microscope with a tensile tester, the fine
slip line structure can be analyzed. This equipment is particularly s
uitable to follow the course of plastic flow from the emergence of the
first few dislocations from bulk crystal to the stages of work harden
ing. The motivations, instrumentation and results on LiF single crysta
l are described. (C) 1998 American Vacuum Society.