Am. Frisch et al., INTERPRETATION OF REFLECTANCE ANISOTROPY SPECTROSCOPY SPECTRA OF ZNSE(001) GROWN ON GAAS(001) IN TERMS OF BULK, INTERFACE, AND SURFACE CONTRIBUTIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2350-2354
We combine reflectance anisotropy spectroscopy (RAS) with low energy e
lectron diffraction, Auger electron spectroscopy, and soft x-ray photo
emission spectra to analyze the surface optical anisotropy of ZnSe(001
). Clean surfaces were prepared by thermal desorption of a protective
Se cap from ZnSe layers of,different thicknesses grown by molecular be
am epitaxy on GaAs(001). Two surface reconstructions have been prepare
d by subsequent annealing, the Se-rich (2x1) reconstruction and the Zn
-rich c(2x2) reconstruction. By modifying the surfaces either through
submonolayer deposition of Sb or a short exposure to atmosphere it was
possible to distinguish between surface and bulk/interface contributi
ons to the optical anisotropy. Only on disordered, very Se-rich ZnSe(0
01) surfaces prepared at low annealing temperatures RAS features possi
bly related to electronic surface states are found. RAS spectra of the
(2x1) and the c(2x2) surfaces are correlated with surface morphology
and ordering rather than surface reconstruction and show features near
the critical points of the bulk ZnSe band structure. (C) 1998 America
n Vacuum Society.