INTERPRETATION OF REFLECTANCE ANISOTROPY SPECTROSCOPY SPECTRA OF ZNSE(001) GROWN ON GAAS(001) IN TERMS OF BULK, INTERFACE, AND SURFACE CONTRIBUTIONS

Citation
Am. Frisch et al., INTERPRETATION OF REFLECTANCE ANISOTROPY SPECTROSCOPY SPECTRA OF ZNSE(001) GROWN ON GAAS(001) IN TERMS OF BULK, INTERFACE, AND SURFACE CONTRIBUTIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2350-2354
Citations number
20
Categorie Soggetti
Physics, Applied","Engineering, Eletrical & Electronic
ISSN journal
10711023
Volume
16
Issue
4
Year of publication
1998
Pages
2350 - 2354
Database
ISI
SICI code
1071-1023(1998)16:4<2350:IORASS>2.0.ZU;2-Z
Abstract
We combine reflectance anisotropy spectroscopy (RAS) with low energy e lectron diffraction, Auger electron spectroscopy, and soft x-ray photo emission spectra to analyze the surface optical anisotropy of ZnSe(001 ). Clean surfaces were prepared by thermal desorption of a protective Se cap from ZnSe layers of,different thicknesses grown by molecular be am epitaxy on GaAs(001). Two surface reconstructions have been prepare d by subsequent annealing, the Se-rich (2x1) reconstruction and the Zn -rich c(2x2) reconstruction. By modifying the surfaces either through submonolayer deposition of Sb or a short exposure to atmosphere it was possible to distinguish between surface and bulk/interface contributi ons to the optical anisotropy. Only on disordered, very Se-rich ZnSe(0 01) surfaces prepared at low annealing temperatures RAS features possi bly related to electronic surface states are found. RAS spectra of the (2x1) and the c(2x2) surfaces are correlated with surface morphology and ordering rather than surface reconstruction and show features near the critical points of the bulk ZnSe band structure. (C) 1998 America n Vacuum Society.