J. Nakamura et al., CHEMICAL BONDING FEATURES FOR FAULTILY STACKED INTERFACES OF GAAS(111), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2426-2431
The electronic states for normally stacked and faultily stacked layers
on the GaAs{111} A, B surfaces are calculated by use of the discrete
variational X alpha cluster method and the plane wave nonlocal pseudop
otential method. The results show that chemical bondings between atoms
are not as ionic in the faultily stacked layer of (111) B as they are
in the (111)A case, and that on the (111) A surface more attractive C
oulomb interaction energy is gained in the faulty stacking layer than
in the normal stacking one. These results explain well the more freque
nt emergence of in-plane faults in the (111) A surface, which is well
known in GaAs{111} A, B growth experiments. The total energy calculati
ons also provide quantitative interpretation of such growth features.
(C) 1998 American Vacuum Society.