FOCUSED ION-BEAM TECHNOLOGY APPLIED TO MICROSTRUCTURE FABRICATION

Citation
Mj. Vasile et al., FOCUSED ION-BEAM TECHNOLOGY APPLIED TO MICROSTRUCTURE FABRICATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2499-2505
Citations number
13
Categorie Soggetti
Physics, Applied","Engineering, Eletrical & Electronic
ISSN journal
10711023
Volume
16
Issue
4
Year of publication
1998
Pages
2499 - 2505
Database
ISI
SICI code
1071-1023(1998)16:4<2499:FITATM>2.0.ZU;2-C
Abstract
Focused ion beams (FIBs) have found a place in several research thrust s for the manufacture of mini or micro mechanical objects. This articl e reports the use of FIB in three distinct applications in microfabric ation: prototype structures, micron-sized machine tools and microsurgi cal manipulators, and ion milling of three dimensional features. Examp les of each of these applications are given with the FIB component ide ntified as the enabling or critical component in the technology. The p ossibility of using FIB milling as part of a production method for mic ron-sized machine tools is discussed, and the mass production conseque nces of molds fabricated by three dimensional ion beam milling is also considered. The mathematical procedure and programming steps needed t o accurately control FIB three dimensional milling are outlined. (C) 1 998 American Vacuum Society.