A NEW LPE GROWTH METHOD OF SEMICONDUCTOR HETEROSTRUCTURES WITH THICKNESS PROFILE VARIATION OF EPITAXIAL LAYERS

Citation
Va. Mishurnyi et al., A NEW LPE GROWTH METHOD OF SEMICONDUCTOR HETEROSTRUCTURES WITH THICKNESS PROFILE VARIATION OF EPITAXIAL LAYERS, Journal of electronic materials, 27(8), 1998, pp. 1003-1004
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
27
Issue
8
Year of publication
1998
Pages
1003 - 1004
Database
ISI
SICI code
0361-5235(1998)27:8<1003:ANLGMO>2.0.ZU;2-3
Abstract
We have investigated and developed a method for the LPE growth of laye rs with approximately parabolic cross section. The channels were creat ed during the growth process by modulating the liquid phase thickness with W or Mo wires parallel to the substrate. The main parameters of t he channel can be controlled by changing the wire's diameter and its d istance from the substrate. This method can be incorporated directly i nto the growth process of a laser structure with an unstable resonator without the need of additional treatments as chemical etching, to pro duce the channel structure.