FAULT-DETECTION IN TFCMOS DFCMOS COMBINATIONAL GATES

Authors
BUONANNO G LOMBARDI F SCIUTO D SHEN YN
Citation
G. Buonanno et al., FAULT-DETECTION IN TFCMOS DFCMOS COMBINATIONAL GATES, Integration, 15(2), 1993, pp. 201-227
Citations number
29
Categorie Soggetti
System Science","Computer Sciences","Computer Applications & Cybernetics
Journal title
Integration → ACNP
ISSN journal
01679260
Volume
15
Issue
2
Year of publication
1993
Pages
201 - 227
Database
ISI
SICI code
0167-9260(1993)15:2<201:FITDCG>2.0.ZU;2-S
Abstract
A design for testability technique and an associated test algorithm ar e presented for CMOS combinational circuits. It will be shown that stu ck-open faults, stuck-on faults, bridging faults and delay faults can all be detected in CMOS combinational circuits using such test procedu re.