My. Chuang et al., 3-DIMENSIONAL BASE DISTRIBUTED EFFECTS OF LONG STRIPE BJTS - AC EFFECTS ON INPUT CHARACTERISTICS, I.E.E.E. transactions on electron devices, 45(9), 1998, pp. 1993-2001
The small-signal voltage and current distributed effects in the polysi
licon and intrinsic base regions of long stripe bipolar junction trans
istors (BJT's) at high frequencies are investigated, and simple analyt
ic equations describing the voltage and current distribution in these
regions are derived. It is shown that the frequency-dependent debiasin
g effects in the polysilicon contacts and intrinsic base region change
the current behavior and modulate the input admittance, The current a
nd voltage distributions in the polysilicon region are nonuniform and
vary with frequency, Conventional two-dimensional (2-D) device simulat
ions cannot accurately predict this three-dimensional (3-D) effect. A
quasi-3D simulation scheme combining a 2-D device simulator and the di
stributed model is presented to properly and efficiently describe the
input characteristics of the de,ice at high frequencies. It is also sh
own the use of various polysilicon sheet resistances, geometry sizes,
and layout structures changes the distributed characteristics and modu
lates device performance at high frequencies. The impact of the layout
structure and geometry size on RF circuit design due to the distribut
ed effects is also studied.