3-DIMENSIONAL BASE DISTRIBUTED EFFECTS OF LONG STRIPE BJTS - AC EFFECTS ON INPUT CHARACTERISTICS

Citation
My. Chuang et al., 3-DIMENSIONAL BASE DISTRIBUTED EFFECTS OF LONG STRIPE BJTS - AC EFFECTS ON INPUT CHARACTERISTICS, I.E.E.E. transactions on electron devices, 45(9), 1998, pp. 1993-2001
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189383
Volume
45
Issue
9
Year of publication
1998
Pages
1993 - 2001
Database
ISI
SICI code
0018-9383(1998)45:9<1993:3BDEOL>2.0.ZU;2-0
Abstract
The small-signal voltage and current distributed effects in the polysi licon and intrinsic base regions of long stripe bipolar junction trans istors (BJT's) at high frequencies are investigated, and simple analyt ic equations describing the voltage and current distribution in these regions are derived. It is shown that the frequency-dependent debiasin g effects in the polysilicon contacts and intrinsic base region change the current behavior and modulate the input admittance, The current a nd voltage distributions in the polysilicon region are nonuniform and vary with frequency, Conventional two-dimensional (2-D) device simulat ions cannot accurately predict this three-dimensional (3-D) effect. A quasi-3D simulation scheme combining a 2-D device simulator and the di stributed model is presented to properly and efficiently describe the input characteristics of the de,ice at high frequencies. It is also sh own the use of various polysilicon sheet resistances, geometry sizes, and layout structures changes the distributed characteristics and modu lates device performance at high frequencies. The impact of the layout structure and geometry size on RF circuit design due to the distribut ed effects is also studied.