ON CHIP TESTING DATA CONVERTERS USING STATIC PARAMETERS

In this paper, built-in self-test (BIST) approach has been applied to test digital-to-analog (D/A) and analog-to-digital (A/D) converters. O ffset, gain, integral nonlinearity (INL), and differential nonlinearit y (DNL) errors and monotonicity are tested without using mixed-made or logic test equipment. An offline calibrating technique has been used to insure the accuracy of BIST circuitry and to reduce area overhead b y avoiding the use of high quality analog blocks. The proposed BIST st ructure presents a compromise between test cost, area overhead, and te st time. By a minor modification the test structure would be able to l ocalize the fail situation. The same approach may be used to construct a fast law cost off-chip D/A converter tester, The BIST circuitry has been designed and evaluated using complementary metal-oxide-semicondu ctor (CMOS) 1.2 mu m technology.